Applied Scanning Probe Methods IV: Industrial Applications (NanoScience and Technology) (v. 4)

✍ Scribed by Bharat Bhushan, Harald Fuchs

Publisher: Springer
Year: 2006
Tongue: English
Leaves: 318
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

✦ Subjects

Физика;Практикумы, экспериментальная физика и физические методы исследования;

📜 SIMILAR VOLUMES

Applied Scanning Probe Methods IV: Indus

📁 Applied Scanning Probe Methods IV: Industrial Applications

✍ Joseph M. Kinsella, Albena Ivanisevic (auth.), Professor Bharat Bhushan, Profess 📂 Library 📅 2006 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

From the reviews:"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed

Applied Scanning Probe Methods XIII: Bio

📁 Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications (NanoScience and Technology) (No. XIII)

✍ Bharat Bhushan, Harald Fuchs 📂 Library 📅 2008 🌐 English

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast t

Applied Scanning Probe Methods II: Scann

📁 Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2)

✍ Bharat Bhushan, Harald Fuchs 📂 Library 📅 2006 🏛 Springer 🌐 English

Applied Scanning Probe Methods VII: Biom

📁 Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications

✍ Michael Nosonovsky, Bharat Bhushan (auth.), Professor Bharat Bhushan, Professor 📂 Library 📅 2007 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

Applied Scanning Probe Methods VII: Biom

📁 Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications

✍ Michael Nosonovsky, Bharat Bhushan (auth.), Professor Bharat Bhushan, Professor 📂 Library 📅 2007 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational asp

Applied Scanning Probe Methods VII: Biom

📁 Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications

✍ Michael Nosonovsky, Bharat Bhushan (auth.), Professor Bharat Bhushan, Professor 📂 Library 📅 2007 🏛 Springer-Verlag Berlin Heidelberg 🌐 English