Applications of variable angle spectroscopic ellipsometry to strained SiGe alloy heterostructures

✍ Scribed by A.R. Heyd; S.A. Alterovitz; E.T. Croke; K.L. Wang; C.H. Lee

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 587 KB
• Volume: 270
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(95)06848-1