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Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices

✍ Scribed by David J. Smith; David A. Cullen; Lin Zhou; Martha R. McCartney

Book ID: 104056458
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 1016 KB
Volume: 50
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2010.07.155

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