Applications of microfocussed ion beams in surface and thin film analysis : R. E. Thurstans and J. Wolstenholme. Vacuum37, 289 (1987)

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 69 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90255-7