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Application-Specific Bridging Fault Testing of FPGAs

✍ Scribed by Mehdi Baradaran Tahoori


Book ID
111589210
Publisher
Springer US
Year
2004
Tongue
English
Weight
417 KB
Volume
20
Category
Article
ISSN
0923-8174

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Static test compaction for IDDQ testing
✍ Yoshinobu Higami; Kewal K. Saluja; Yuzo Takamatsu; Kozo Kinoshita πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 335 KB πŸ‘ 2 views

This paper presents a static test compaction method for IDDQ testing of sequential circuits. Test compaction reduces test application time and tester memory and consequently reduces testing cost. Particularly for IDDQ testing, measurement of IDDQ is time-consuming, and thus test compaction is a very