Application of wavelet analysis in optical coherence tomography for obscured pattern recognition
✍ Scribed by C. Buranachai; P. Thavarungkul; P. Kanatharana; I.V. Meglinski
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 107 KB
- Volume
- 6
- Category
- Article
- ISSN
- 1612-2011
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✦ Synopsis
Nowadays the optical coherent tomography (OCT) is one of the most perspective optical diagnostic modalities widely used for non-invasive imaging of the internal structure of various complex turbid media from a range of composite materials to biological tissues. OCT has been attracting a great amount of attention due to its effective capability rejecting multiple scattering. However, for highly scattered composite structures the multiple scattering still remains a factor limiting OCT to the quasiballistic regime. In order to enhance the OCT imaging capabilities and reduce the statistical noise associated with the multiple scattering the wavelet analysis has been applied. The wavelet analysis has been used to decompose the OCT images of printed stripes covered by a highly scattered and not transparent layer of white correction tape. The obtained results demonstrate a significant reduction of speckle noise background and enhancement of OCT images of the obscured patterns. This likely to be enabled extending the applicability of the combined OCT-wavelet decomposition analysis to investigate sensitive documents, historical artworks and valuable security papers. Depth, mm 1.0 1.5 0.5 0 2.0 1.0 1.5 0.5 0 Lateral position, mm
OCT image of hidden printed stripes after applying the wavelet decomposition analysis