✦ LIBER ✦
Application of VRS Methodology for the Statistical Assessment of BTI in MG/HK CMOS Devices
✍ Scribed by Kerber, Andreas; Cartier, Eduard
- Book ID
- 126660018
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 725 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0741-3106
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