Application of ultrasonic microscopy to non-destructive evaluation

✍ Scribed by S. Joseph

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 594 KB
• Volume: 122
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/0921-5093(89)90785-5

✦ Synopsis

In the field of microdefect detection and imaging, in complement to traditional techniques such as X-ray and scanning electron microscopies, there is now a very useful technique for non-destructive evaluation: high frequency scanning acoustic microscopy. A new generation of industrial microscopies has been developed for use in the range from 50 to 100 MHz. Several examples are shown here of scanning electron microscopy used in bulk examination of ceramic or microelectronic materials and metals.