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Application of type F13 photocompensated comparators in testing

✍ Scribed by V. V. Kudrin


Book ID
112451799
Publisher
Springer US
Year
1966
Tongue
English
Weight
182 KB
Volume
9
Category
Article
ISSN
0543-1972

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Measurement of substrate noise in CMOS i
✍ Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 175 KB

It is important to reduce substrate noise in the analog/digital mixed-signal integrated circuits. In order to understand the influence of substrate noise, a technique to measure substrate noise using a chopper-type voltage comparator based on an equivalent sampling method is proposed. The substrate