Application of TSEE and TSD methods to investigations on trap levels - in Yb2O3 thin films deposited by electron beam evaporation

✍ Scribed by Wiktorczyk, T. ;Wesołowska, C.

• Book ID: 105377534
• Publisher: John Wiley and Sons
• Year: 1984
• Tongue: English
• Weight: 184 KB
• Volume: 82
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210820155