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Application of tip-enhanced microscopy for nonlinear Raman spectroscopy

✍ Scribed by Ichimura, Taro; Hayazawa, Norihiko; Hashimoto, Mamoru; Inouye, Yasushi; Kawata, Satoshi

Book ID: 120441195
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 656 KB
Volume: 84
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1647277

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## Abstract This paper presents an overview on the principles of tip‐enhanced Raman spectroscopy (TERS). The technique can be used to record Raman images of carbon nanotubes with high spatial resolution. The high resolution is made possible by local enhancement of the incident and scattered fields.