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Application of the UHF technique for contactless measurement of the speed of rotation

✍ Scribed by E. A. Stakhov


Book ID
112452421
Publisher
Springer US
Year
1962
Tongue
English
Weight
227 KB
Volume
5
Category
Article
ISSN
0543-1972

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The recombination lifetime of free carriers in silicon wafers can be determined by measuring the reflected microwave power from the sample following a pulsed optical excitation of free carriers. The total recombination process in semiconductor wafers consists of bulk and surface contributions, which