Application of the selective atom diffraction method to the cation distribution in high Tc bismuth cuprates

✍ Scribed by Philip Coppens; Peter Lee; Gao Yan; Sheu Hwo-Shuenn

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 536 KB
• Volume: 52
• Category: Article
• ISSN: 0022-3697
• DOI: 10.1016/0022-3697(91)90202-b