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Application of the Quantized Hall Effect to a New Resistance Standard at VSL

โœ Scribed by Van Der Wel, W.; Harmans, Kees J. P. M.; Kaarls, Robert; Mooij, J. E.


Book ID
114628888
Publisher
IEEE
Year
1985
Tongue
English
Weight
625 KB
Volume
IM-34
Category
Article
ISSN
0018-9456

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