Application of the method of brather for the determination of complex dielectric permittivity from measurements of isothermal polarization current
β Scribed by Ribelles, J. L. Gomez ;Calleja, R. Diaz
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 1985
- Tongue
- English
- Weight
- 333 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0098-1273
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π SIMILAR VOLUMES
## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a shortβcircuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o
We have determined the p, T, , x phase boundaries in three mixtures of 1 y x CO q 2 4 Ε½ . x C H , with x s 0.2516 , 0.4924 , and 0.7397 , in the vicinity of the critical locus from 2 6 6 5 8 measurements of the relative dielectric permittivity . We combined accurate measurements r of with the Clausi
output power is lower, as predicted by both approaches. When the reflectivity is small, the oscillation energy is small. Thus, the lasing wavelength has a lower number of photons available for feedback and energy accumulation. At higher reflectivities, although the energy within the cavity is large,