𝔖 Bobbio Scriptorium
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Application of the Eyring Model to capacitor aging data : H. S. Endicott, B. D. Hatch and R. G. Sohmer, IEEE Transactions on Component Parts, p. 34 (March 1965)


Book ID
113190266
Publisher
Elsevier Science
Year
1966
Tongue
English
Weight
174 KB
Volume
5
Category
Article
ISSN
0026-2714

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