✦ LIBER ✦
Application of the atomic force microscope to integrated circuit reliability and failure analysis : Mark R. Rodgers. IEEE/IRPS, 250 (1991)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 128 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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