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Application of spectroscopic ellipsometry to study the effect of surface treatments on cadmium telluride films

✍ Scribed by B.R. Mehta; Satyendra Kumar; Kanwaljeet Singh; K.L. Chopra

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 177 KB
Volume: 164
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90147-2

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