Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles
✍ Scribed by R.A. Ganeev; A.I. Ryasnyansky; A.L. Stepanov; C. Marques; R.C. da Silva; E. Alves
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 245 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0030-4018
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✦ Synopsis
The results of investigation of the nonlinear refraction of sapphire doped by Ag, Cu, and Au nanoparticles using the reflection Z-scan technique are presented. The real parts of the third-order nonlinear susceptibility of Ag:Al 2 O 3 , Au:Al 2 O 3 , and Cu:Al 2 O 3 were measured using the fundamental wavelength of Nd:YAG laser radiation (k = 1064 nm, t = 55ps). It was shown that the Ag:Al 2 O 3 possessed by self-focusing properties (n 2 = 1.8 • 10 À11 cm 2 W À1 ), whereas the Au:Al 2 O 3 and Cu:Al 2 O 3 showed the self-defocusing properties (n 2 = À1.46 • 10 À10 and À1.7 • 10 À11 cm 2 W À1 , respectively). The real part of third-order nonlinear susceptibility of Au:Al 2 O 3 was measured to be 10 À8 esu. The mechanisms of nonlinear refraction are discussed.