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Application of quantitative SIMS to determine the influence of impurities on the electrical properties of mercury cadmium telluride

✍ Scribed by A.P. Botha; H.J. Strydom; M.A. Marais

Book ID
113279090
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
294 KB
Volume
35
Category
Article
ISSN
0168-583X

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Cadmium-rich CdxHgl \_xTe (CMT) thin films were grown by cathodic electrodeposition. Two main fabrication parameters were taken into account: deposition potential and mercury content in solution. Different layers of CMT deposited by varying these two parameters were studied by X-ray diffraction, ene