Application of Positron Annihilation Lifetime Technique for γ-Irradiation Stresses Study in Chalcogenide Vitreous Semiconductors

✍ Scribed by O. Shpotyuk; J. Filipecki; R. Golovchak; A. Kovalskiy; M. Hyla

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 87 KB
• Volume: 4
• Category: Article
• ISSN: 1438-1656
• DOI: 10.1002/1527-2648(20020806)4:8<571::aid-adem571>3.0.co;2-e