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Application of on-wafer TRL calibration on the measurement of microwave properties of Ba/sub 0.5/Sr/sub 0.5/TiO/sub 3/ films

✍ Scribed by Hang-Ting Lue, ; Tseung-Yuen Tseng,

Book ID: 120941369
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 530 KB
Volume: 48
Category: Article
ISSN: 0885-3010
DOI: 10.1109/58.971716

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