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Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

✍ Scribed by Motaghian Nezam, S. M.; Joo, C.; Tearney, G. J.; de Boer, J. F.


Book ID
115410025
Publisher
Optical Society of America
Year
2008
Tongue
English
Weight
332 KB
Volume
16
Category
Article
ISSN
1094-4087

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