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Application of magnetic force microscopy in nanomaterials characterization

✍ Scribed by Alex de Lozanne

Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
621 KB
Volume
69
Category
Article
ISSN
1059-910X

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✦ Synopsis

Abstract

This review describes the basic technical aspects of magnetic force microscopy and how this technique has been applied to the study of colossal magnetoresistance materials, superconductors, and patterned magnetic materials. Recently, current distribution in a patterned aluminum strip has been measured by magnetic force microscopy, opening the possibility of measuring currents in buried interconnects in integrated circuits. Microsc. Res. Tech., 2006. Β© 2006 Wiley‐Liss, Inc.

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