Application of IR reflection-absorption spectroscopy for studying dielectric layers in In2S3-SiOX-Si heterostructures

✍ Scribed by S. S. Kil'chitskaya; T. S. Kil'chitskaya; V. A. Skryshevskii; V. I. Strikha; V. P. Tolstoi

• Publisher: Springer US
• Year: 1988
• Tongue: English
• Weight: 331 KB
• Volume: 48
• Category: Article
• ISSN: 0021-9037
• DOI: 10.1007/bf00663300