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Application of IR ellipsometry to determination of the film thickness of a polytetrafluoroethylene sample modified in direct-current discharge

✍ Scribed by M. O. Makeev; Yu. A. Ivanov; S. A. Meshkov; A. B. Gil’man; M. Yu. Yablokov

Book ID: 110165032
Publisher: SP MAIK Nauka/Interperiodica
Year: 2011
Tongue: English
Weight: 154 KB
Volume: 45
Category: Article
ISSN: 0018-1439
DOI: 10.1134/s0018143911060129

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