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Application of Interference Microscopy and IR Microscopy for Characterizing and Investigating Mass Transport in Nanoporous Materials

✍ Scribed by L. Heinke; C. Chmelik; P. Kortunov; D. M. Ruthven; D. B. Shah; S. Vasenkov; J. Kärger


Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
811 KB
Volume
30
Category
Article
ISSN
0930-7516

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