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Application of Infrared Interferometry for Quantitative Analysis of Chemical Groups Grafted onto the Internal Surface of Porous Silicon Nanostructures

✍ Scribed by Alekseev, S. A.; Lysenko, V.; Zaitsev, V. N.; Barbier, D.


Book ID
126126078
Publisher
American Chemical Society
Year
2007
Tongue
English
Weight
122 KB
Volume
111
Category
Article
ISSN
1932-7447

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