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Application of Image Processing to Characterize Patterning Noise in Self-Assembled Nano-Masks for Bit-Patterned Media

✍ Scribed by Nabavi, S.; Vijaya Kumar, B.V.K.; Bain, J.A.; Hogg, C.; Majetich, S.A.


Book ID
114653239
Publisher
IEEE
Year
2009
Tongue
English
Weight
615 KB
Volume
45
Category
Article
ISSN
0018-9464

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