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Application of FTIR phase-modulated ellipsometry to the characterisation of thin films on surface-enhanced IR absorption active substrates

✍ Scribed by E Garcia-Caurel; E Bertran; A Canillas


Book ID
117226587
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
375 KB
Volume
398-399
Category
Article
ISSN
0040-6090

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