Application of Fourier analysis to the X-ray diffraction pattern of filings of a face-centred cubic copper–silicon–manganese alloy

✍ Scribed by Vasudevan, R.

• Book ID: 114497664
• Publisher: International Union of Crystallography
• Year: 1970
• Tongue: English
• Weight: 314 KB
• Volume: 3
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889870006064