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Application of evolved gas analysis to surface characterization of organically-modified inorganic materials

โœ Scribed by M.J. Hudson; K.D. Helps; S.E. Golunski; U. Costantino

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
624 KB
Volume
161
Category
Article
ISSN
0040-6031

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to analyse the surface composition of organic-inorganic hybrid solids obtained by a sol-gel process. Gels of type O 1.5 Si-R-SiO 1.5 , obtained from bis-silylated precursors (R'O) 3 -R-Si(OR') 3 (R' = Me, Et and R = (-CH 2 ) n -