๐”– Bobbio Scriptorium
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Application of electrical capacitance tomography to the void fraction measurement of two-phase flow

โœ Scribed by Zhiyao Huang; Baoliang Wang; Haiqing Li


Book ID
114629211
Publisher
IEEE
Year
2003
Tongue
English
Weight
358 KB
Volume
52
Category
Article
ISSN
0018-9456

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