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Application of elastic IR light scattering for investigation of large-scale electrically active defects in semiconductors

✍ Scribed by V.V. Voronkov; S.E. Zabolotskiy; V.P. Kalinushkin; D.I. Murin; M.G. Ploppa; V.A. Yuryev


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
396 KB
Volume
103
Category
Article
ISSN
0022-0248

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