Application of eddy-current testing technique for high-density double-Layer printed circuit board inspection

✍ Scribed by Chomsuwan, K.; Yamada, S.; Iwahara, M.; Wakiwaka, H.; Shoji, S.

• Book ID: 114650601
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 840 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2005.855173