𝔖 Bobbio Scriptorium
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Application of confocal laser scanning microscopy, atomic force microscopy, and the profilometric method in quantitative fractography

✍ Scribed by Jan Cwajna; Stanisław Roskosz


Book ID
114340708
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
938 KB
Volume
46
Category
Article
ISSN
1044-5803

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