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Application of atomic force microscopy in determining the fractal dimension of the mirror, mist, and hackle region of silica glass

✍ Scribed by R.L. Smith; J.J. Mecholsky Jr.


Book ID
113780487
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
466 KB
Volume
62
Category
Article
ISSN
1044-5803

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