✦ LIBER ✦
Application of angle-resolved X-ray photon electron spectroscopy for interface and layer growth studies demonstrated on Ti/Ta-based films deposited on SiO2
✍ Scribed by S. Oswald; F. Oswald
- Book ID
- 105892831
- Publisher
- Springer
- Year
- 2009
- Tongue
- English
- Weight
- 227 KB
- Volume
- 396
- Category
- Article
- ISSN
- 1618-2650
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