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Application of an Ordinal Optimization Algorithm to the Wafer Testing Process

✍ Scribed by Shin-Yeu Lin; Shih-Cheng Horng

Book ID: 117937472
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 224 KB
Volume: 36
Category: Article
ISSN: 1083-4427
DOI: 10.1109/tsmca.2006.878965

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