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Application of a method for matrix correction using compton-scattering for the quantitative determination of metals in silica by wavelength dispersive X-ray fluorescence spectroscopy (WDXRF)

✍ Scribed by M. Lührmann; F. Wegener; A. Kettrup

Book ID: 112491707
Publisher: Springer
Year: 1986
Tongue: English
Weight: 425 KB
Volume: 323
Category: Article
ISSN: 1618-2650
DOI: 10.1007/bf01172903

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