๐”– Bobbio Scriptorium
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Application of a Failure Driven Test Profile in Random Testing

โœ Scribed by Tsong Yueh Chen; Fei-Ching Kuo; Huai Liu


Book ID
114668646
Publisher
IEEE
Year
2009
Tongue
English
Weight
559 KB
Volume
58
Category
Article
ISSN
0018-9529

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