Applicability of the reference cell method to polycrystalline silicon cells with the spectral response shift under illumination

✍ Scribed by Ryuichi Shimokawa; Yutaka Hayashi; Fumiaki Nagamine

• Publisher: Elsevier Science
• Year: 1985
• Weight: 521 KB
• Volume: 15
• Category: Article
• ISSN: 0379-6787
• DOI: 10.1016/0379-6787(85)90071-7

✦ Synopsis

In current practice, the reference cell method is used to evaluate the photovoltaic performance of single-crystal cells. The applicability of this method to polycrystalline silicon cells with non-linear response to illumination intensity was studied. First, spectral responses of EFG (edge-defined film fed growth) and CAST (casting, SISLO) silicon cells were measured as a function of the bias light intensity (1 mW cm-: -100 mW cm -2) and the bias light spectral distribution; based on these data, the non-linearity of the short~ircuit current with respect to the illumination intensity was estimated. Next, the measurement error in the reference cell method due to spectral mismatch between reference cell and test cell was calculated for various spectral frradiances.