𝔖 Bobbio Scriptorium
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Applicability of the multi-hit model to calculate the track etch rate in µm-scale in CR-39 detectors

✍ Scribed by Awad, E. M.


Book ID
127371789
Publisher
Taylor and Francis Group
Year
2003
Tongue
English
Weight
152 KB
Volume
158
Category
Article
ISSN
1042-0150

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