APMP international comparison of AC-DC transfer standards at the lowest attainable level of uncertainty

✍ Scribed by Budovsky, I.; Abidin, A.R.B.Z.; Yan, A.Y.K.; LingXiang Liu; Rustagi, V.K.; Govil, A.K.; Klonz, M.; Yih-cheng Wei; Early, M.D.; Sasaki, H.; Fujiki, H.; Kumtawee, C.; Charoensook, A.; Sung-Won Kwon; Son, N.A.; Suprianto, B.; Temba, M.; Ruiz, M.; Leones, S.P.B., Jr.

• Book ID: 114629767
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 223 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2004.843088