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Aperture edge scattering in focused MeV ion beam lithography and nuclear microscopy: An application for the GEANT4 toolkit

✍ Scribed by S. Gorelick; Harry J. Whitlow


Book ID
108224529
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
444 KB
Volume
267
Category
Article
ISSN
0168-583X

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