Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films

✍ Scribed by Parinda Vasa; B.P. Singh; Praveen Taneja; Pushan Ayyub

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 241 KB
• Volume: 233
• Category: Article
• ISSN: 0030-4018
• DOI: 10.1016/j.optcom.2004.01.051