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Antiferromagnet Thickness Dependence of the Training Effect in Exchange-Coupled CoFe/MnIr Bilayers

✍ Scribed by Dong Young Kim; Seok Soo Yoon; Cheol-Gi Kim; Tsunoda, M.; Takahashi, M.

Book ID: 114653279
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 389 KB
Volume: 45
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2009.2022955

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