Anomalous positive exchange bias in Ni[sub 80]Fe[sub 20]∕Ni[sub x]Fe[sub 1−x]O thin-film bilayers induced by ion-beam deposition effects

✍ Scribed by van Lierop, J.; Lin, K.-W.; Ouyang, H.; Tzeng, Y.-M.; Guo, Z.-Y.

• Book ID: 121309784
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 439 KB
• Volume: 99
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.2162034