Anomalous charge loss from floating-gate memory cells due to heavy ions irradiation

✍ Scribed by Cellere, G.; Paccagnella, A.; Larcher, L.; Chimenton, A.; Wyss, J.; Candelori, A.; Modelli, A.

• Book ID: 120166089
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 370 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2002.805339