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Anomalous C-V characteristics of implanted poly MOS structure in n/sup +//p/sup +/ dual-gate CMOS technology
✍ Scribed by Lu, C.-Y.; Sung, J.M.; Kirsch, H.C.; Hillenius, S.J.; Smith, T.E.; Manchanda, L.
- Book ID
- 121268176
- Publisher
- IEEE
- Year
- 1989
- Tongue
- English
- Weight
- 254 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0741-3106
- DOI
- 10.1109/55.31717
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